DFT(Design for Testability) involves using SCAN, ATPG and BIST techniques to add testability to Hardware design. These techniques are targeted towards making it easier to develop and apply tests to the manufactured hardware. There tests in turn help catch manufacturing defects like stuck at 0, 1 faults, etc.
DFT Training will focus on all aspects of testability flow including testability basics, SOC Scan Architecture, different scan types, ATPG DRC Debug, ATPG Simulation debug, and DFT diagnosis. DFT Training course will also focus on JTAG, MemoryBIST, LogicBIST, Scan and ATPG, test compression techniques and Hierarchical scan design.
As part of DFT Training, a complex design example with variety of memories spread around the design used as a reference for learning all testability. While MBIST used to test memories. Boundary scan is a requirement for designs, used to control the MBIST controllers that are created to minimize the need for having extra external pins to run the memory tests. ATPG test patterns will be created for various different fault models like stuck-at, transition delay, path delay fault models. Various TestKompress techniques will be used to compress test patterns to ensure patterns can be applied on minimal number of IO pins used during test. Compressed test patterns will run more quickly on the production test floor and require less tester memory. Patterns are validated through Simulations.
DFT Training course is designed as per the current industry requirements with multiple hands on projects based on Scan, ATPG and MBIST. DFT Training will help student with in-depth knowledge of all testability techniques. Hands-on project will involve creating large number of test cases for various aspects like Scan insertion, Compression and ATPG pattern generation using MentorGraphics Tessent tool. More importance is given to basic concepts, interaction sessions, hands-on, important notes and assignments.
MentorGraphics Tessent tool will be used for training. As per survey, it is used by more than 80% companies for DFT. Student will have access to tool for during the course, with provision to extend beyond. Student will get access to tool both at institute and has option to connect to servers from home using VPN.
Student will also get access to Synopsys tool suite.
Design For Testability
DFT(Design for Testability) involves using SCAN, ATPG, JTAG and BIST techniques to add testability to the Hardware design. These techniques are targeted for developing and applying tests to the manufactured hardware. There tests in turn help catch manufacturing defects like stuck at 0, 1 faults, and transition delay faults etc.
DFT Training will focus on all aspects of testability flow including DFT basics, various fault types, SOC Scan Architecture, different scan types, ATPG DRC Debug, ATPG Simulation debug, and DFT diagnosis. DFT Training course will also focus on JTAG, MemoryBIST, LogicBIST, Scan and ATPG, test compression techniques and Hierarchical scan design.
As part of DFT Training, a complex design example with variety of memories spread around the design used as a reference for learning all testability. While MBIST used to test memories. Boundary scan is a requirement for designs, used to control the MBIST controllers that are created to minimize the need for having extra external pins to run the memory tests. ATPG test patterns will be created for various different fault models like stuck-at, transition delay, path delay fault models. Various TestKompress techniques will be used to compress test patterns to ensure patterns can be applied on minimal number of IO pins used during test. Compressed test patterns will run more quickly on the production test floor and require less tester memory. Patterns are validated through Simulations.
DFT Training course is designed as per the current industry requirements with multiple hands on projects based on Scan, ATPG, JTAG and MBIST. DFT Training will help student with in-depth knowledge of all testability techniques. Hands-on project will involve creating large number of test cases for various aspects like Scan insertion, Compression, JTAG and ATPG pattern generation using Tessent tool. More importance is given to basic concepts, interaction sessions, hands-on, important notes and assignments.
MentorGraphics Tessent tool is used for training. As per industry survey, it is used by more than 80% companies for DFT. Student will have access to tool at the institute for 12 months after course completion, with a provision to extend beyond.
VLSI Basics Course (5 weeks)
- ASIC & VLSI Design Flow
- Session covering complete flow overview from product requirements to Post silicon validation.
- Advanced Digital Design
- 2 weeks dedicated course focusing on all aspects of Digital design.
- www.vlsiguru.com/digital-design-complete
- Verilog programming basics
- 3 Weeks of Verilog training covering all the aspects of Verilog required for DFT engineer
- This course is done in parallel with Advanced Digital design course
- Linux OS
- 1 week training on Linux OS and hands on
- TCL Scripting
- 1 week training on TCL scripting for flow automation
Design For Testability (Below is DFT Main course weekly schedule)
- DFT Basics
- SoC Scan architecture overview
- Types of Scan
- ATPG DRC Debug
- ATPG Simulation Mismatch Debug
- DFT Diagnosis
- JTAG
- MemoryBIST
- LogicBIST
- Scan and ATPG
- Test compression technigues
- Hierarchical Scan Design
Week-1
- Full SOC flow – DFT
- DFT Architecture and Basics
- Test Plan
- Different DFT schemes
- Comparison between Functional and DFT Vectors
Week-2
- Understanding of SCAN Insertion
- Scan methodology
- Types of Scan
- Top-down and Bottom-up Approach
- Scan insertion Flow
- Scan operation
Week-3
- Scan insertion Scripts
- Multiple Clock domains
- Design Rule Checking
- Pre-DRC and Post DRC
- Lock up and Terminal lockup latches
- Hands-on Scan insertion
- Assignments
Week-4
- Introduction to compression
- Compression Architecture
- Decompressor and Compactor
- Compression Ratio
- DRC Analysis
Week-5
- Modular Compression
- X-Masking logic
- Hands-on Compression
- Assignments
Week-6
- Scan insertion with compression
- On-chip clocking for at-speed testing
- Hierarchical Scan Design
- Bypass mode
- Hands on Scan and compression
- Interaction session scan and compression
Week-7
- Introduction to MBIST
- Memory grouping
- Controller generation
- Memory faults
- Algorithms
- Diagnostic mode
Week-8
- ATPG Overview
- Different types of Faults
- Types of fault models
- ATPG algorithm
- Understand complete Test procedure
- Hands on Project
Week-9
- DRC analysis
- Test Coverage and Fault Coverage
- Coverage improvement Analysis
- Chain and Capture patterns
- Assignments
- Simulations- No-timing and Timing simulations
Week-10
- At speed fault model (In detail)
- Understanding Transition fault ATPG
- Two pulse generator
- Test procedure
- Launch on capture and Launch on Shift
- Top-off Pattern generation
- Path delay
Week-11
- Introduction to JTAG
- JTAG State Machine
- Boundary Scan
- Different instructions
- Industry Standard Project
Week-12
- Introduction to LBIST
- SPYGLASS
- Revision
- Mock Interview
| Course | DFT Training |
|---|---|
| Duration | 18 weeks (5 weeks of basics training, 13 weeks of core DFT training) |
| Next Batch | 18/July |
| Demo Session | 18/July(9AM – 12:30PM) |
| Course Enroll | 19/July |
| Schedule | Both Saturday & Sunday(9:30AM – 5PM India time) |
| Course repeats | every 8 weeks |
| Fee | INR 35000 +GST at 18% (Classroom training), INR 44000 +GST at 18%(online training) |
| Tool | Mentor Graphics Tessent, Synopsys DFTAdvisor |
| Mode of training | Classroom training at VLSIGuru Institute(Horamavu) |
| Online training using live training sessions | |
| Tool Access | Tool access at the institute for one year duration |
| Certificate | Issued based on 50% assignment completion as criteria |
| Admission criteria | Student need to undergo evaluation test |
| Batch Size | 20 |
| Assignments | 20 |
| Placement support | Institute does not give any commitment on job or number of opportunities, however student will be provided with opportunities till he/she gets job. |
| Trainer | 12+ Years Exp. |
DFT weekly Schedule
What are the Course Prerequisites?
- Course does not have any pre-requisites. However any exposure to Digital design, VLSI design flow is an added advantage.
What if I miss few sessions during course?
- Each session of course is recorded, missed session videos will be shared
Course has started few weeks back, can I still join the course in between?
- Yes, You will have option to view the recorded videos of course for the sessions missed
- You will have option to repeat the course any time in next 1 year
Do you offer support after course completion?
- Yes, Course fee also includes support for doubt clarification sessions even after course completion
- You have option to mail you queries
- Option to meet in person to clarify doubts
| DFT Course Material | Access |
|---|---|
| Course material | Shared over google drive |
| Course page access | Get login details from Admin |
| Assignments-Checklist-Session notes | Course page |
| Labs | Copy labs from /home/vlsiguru/DFT/ to /home/user_ID/ Refer to README files in individual folders. |
| Labs are available for Scan-compression-JTAG-BIST and pattern simulations. | |
| How to use course material | Shared as part of Course material |
| Resume update | Course page |
| Interview Questions | Uploaded to course page |
Student will get access to assignments, labs, session notes, interview questions, sample resumes on course page.
| Session Notes | Link |
|---|---|
| WEEK1 DFT BASICS | Click here |
| WEEK2 SCAN INSERTION | Click here |
| WEEK3 SCAN INSERTION | Click here |
| WEEK4 | Click here |
| WEEK5 | Click here |
| WEEK6 | Click here |
| WEEK7 MBIST | Click here |
| WEEK8 ATPG | Click here |
| WEEK9 | Click here |
| WEEK10 ATSPEED | Click here |
| ASSIGNMENTS | Link |
|---|---|
| BASIC DFT | Click here |
| SCAN | Click here |
| COMPRESSION | Click here |
| MBIST | Click here |
| ATPG | Click here |
| SIMULATIONS | Click here |
| JTAG | Click here |
| LAB ASSIGNMENTS | Link |
|---|---|
| SCAN | Click here |
| ATPG | Click here |
| PRESENATATIONS | Link |
|---|---|
| DFT Basics | Click here |
| SCAN INSERTION PART1 | Click here |
| SCAN INSERTION PART2 | Click here |
| COMPRESSION | Click here |
| MBIST | Click here |
| LAB INSTRUCTIONS | Link |
|---|---|
| ATPG | Click here |
| SCAN | Click here |
- Target Audience:
- BTech, MTech Freshers planning to make career in DFT
- Engineers with prior experience in other domains of VLSI or experience non-VLSI domains, want to make career in DFT
- Engineering college faculty looking to enhance their VLSI skill set
- Trainer Profile
- 12+ years experience
- Experience of working on multiple complex SOC projects
