Mentor Graphics Tessent flow is the de-facto standard for DFT flow with 80% of market share. Would you go with any other tool flow for DFT training?

DFT(Design for Testability) involves using SCAN, ATPG and BIST techniques to add testability to Hardware design. These techniques are targeted towards making it easier to develop and apply tests to the manufactured hardware. There tests in turn help catch manufacturing defects like stuck at 0, 1 faults, etc.

DFT Training will focus on all aspects of testability flow including testability basics, SOC Scan Architecture, different scan types, ATPG DRC Debug, ATPG Simulation debug, and DFT diagnosis. DFT Training course will also focus on JTAG, MemoryBIST, LogicBIST, Scan and ATPG, test compression techniques and Hierarchical scan design.

As part of DFT Training, a complex design example with variety of memories spread around the design used as a reference for learning all testability. While MBIST used to test memories. Boundary scan is a requirement for designs, used to control the MBIST controllers that are created to minimize the need for having extra external pins to run the memory tests.  ATPG test patterns will be created for various different fault models like stuck-at, transition delay, path delay fault models. Various TestKompress techniques will be used to compress test patterns to ensure patterns can be applied on minimal number of IO pins used during test. Compressed test patterns will run more quickly on the production test floor and require less tester memory. Patterns are validated through Simulations.

DFT Training course is designed as per the current industry requirements with multiple hands on projects based on Scan, ATPG and MBIST. DFT Training will help student with in-depth knowledge of all testability techniques. Hands-on project will involve creating large number of test cases for various aspects like Scan insertion, Compression and ATPG pattern generation using MentorGraphics Tessent tool.  More importance is given to basic concepts, interaction sessions, hands-on, important notes and assignments.

MentorGraphics Tessent is used for training. As per survey, it is used by more than 80% companies for DFT. Student will have access to tool for during the course, with provision to extend beyond. Student will have 24X7 access to tool for complete course duration.

Student will also get access to Synopsys tool suite if required.

Design For Testability

DFT(Design for Testability) involves using SCAN, ATPG, JTAG and BIST techniques to add testability to the Hardware design. These techniques are targeted for developing and applying tests to the manufactured hardware. There tests in turn help catch manufacturing defects like stuck at 0, 1 faults, and transition delay faults etc.

DFT Training will focus on all aspects of testability flow including DFT basics,  various fault types, SOC Scan Architecture, different scan types, ATPG DRC Debug, ATPG Simulation debug, and DFT diagnosis. DFT Training course will also focus on JTAG, MemoryBIST, LogicBIST, Scan and ATPG, test compression techniques and Hierarchical scan design.

As part of DFT Training, a complex design example with variety of memories spread around the design used as a reference for learning all testability. While MBIST used to test memories. Boundary scan is a requirement for designs, used to control the MBIST controllers that are created to minimize the need for having extra external pins to run the memory tests. ATPG test patterns will be created for various different fault models like stuck-at, transition delay, path delay fault models. Various TestKompress techniques will be used to compress test patterns to ensure patterns can be applied on minimal number of IO pins used during test. Compressed test patterns will run more quickly on the production test floor and require less tester memory. Patterns are validated through Simulations.

DFT Training course is designed as per the current industry requirements with multiple hands on projects based on Scan, ATPG, JTAG and MBIST. DFT Training will help student with in-depth knowledge of all testability techniques. Hands-on project will involve creating large number of test cases for various aspects like Scan insertion, Compression, JTAG and ATPG pattern generation using Tessent tool. More importance is given to basic concepts, interaction sessions, hands-on, important notes and assignments.

MentorGraphics Tessent tool is used for training. As per industry survey, it is used by more than 80% companies for DFT. Student will have access to tool at the institute for 12 months after course completion, with a provision to extend beyond.

VLSI Basics Course (5 weeks)

  • ASIC & VLSI Design Flow
    • Session covering complete flow overview from product requirements to Post silicon validation.
  • Advanced Digital Design
    • 2 weeks dedicated course focusing on all aspects of Digital design.
    • www.vlsiguru.com/digital-design-complete
  • Verilog programming basics
    • 3 Weeks of Verilog training covering all the aspects of Verilog required for DFT engineer
    • This course is done in parallel with Advanced Digital design course
  • Linux OS
    • 1 week training on Linux OS and hands on
  • TCL Scripting
    • 1 week training on TCL scripting for flow automation

Design For Testability (Below is DFT Main course weekly schedule)

  • DFT Basics
  • SoC Scan architecture overview
  • Types of Scan
  • ATPG DRC Debug
  • ATPG Simulation Mismatch Debug
  • DFT Diagnosis
  • JTAG
  • MemoryBIST
  • LogicBIST
  • Scan and ATPG
  • Test compression technigues
  • Hierarchical Scan Design

Week-1

  • Introduction to DFT
  • Roles in DFT
  • Full SOC flow – DFT
  • DFT Architecture and Basics
  • Test Plan
  • Different DFT schemes
  • Comparison between Functional and DFT Vectors
  • Defect, Fault and Error

Revision of Digital Concepts- Basics

Week-2

  • Understanding of SCAN Insertion
  • Scan methodology
  • Types of Scan
  • Top-down and Bottom-up Approach
  • Scan insertion Flow
  • Scan operation
  • Clocking structure relation in SCAN

DFT rule checks – Clock and Reset

Week-3

  • Scan insertion Scripts
  • Multiple Clock domains
  • DFT Rule Checks – Advanced (Tristate, PRC, XS)
  • Precautions for building a proper scan chain
  • Edge and Domain Mixing significance
  • Scan Configurations
  • Scan chain Balancing
  • Lock up and Terminal lockup latches
  • Hands-on Scan insertion
  • Explanation about Netlist and Library files
  • Assignments

Week-4

  • Hook-Up Scan sub chains
  • Introduction to compression
  • Compression Architecture
  • Decompressor and Compactor
  • LFSR
  • Compression Ratio
  • Masking Logic
  • One hot Decoder
  • Internal scan chains
  • DRC Analysis
  • Scan Reorder
  • Control signals

Week-5

  • Modular Compression
  • Introduction to Synthesis
  • Hands-on Compression
  • Assignments
  • ATPG Tools Introduction
  • Fault Models
  • Fault Categories
  • Algorithms used in ATPG

Week-6

  • ATPG Flow
  • Coverage Analysis
  • Fault Classes
  • ATPG DRC’s
  • Hands-on Stuck-at ATPG
  • Assignments

Week-7

  • Concepts related to STA – Basics
  • MCP and FP
  • Reports of ATPG
  • Sequential Depth
  • Transition delay faults (TDF)
  • Path delay faults (PDF)
  • Hands-on TDF ATPG

Week-8

  • Types of patterns
  • Formats of patterns
  • Fault grading
  • LOC , LOS and LOES
  • On chip clock control
    • Advantages
    • Dis-advantages
    • Internal structure

Week-9

  • Introduction to Validation
  • Simulations flow
  • Tools for simulation
  • Simulation mismatches debug
  • No timing and Timing based Simulations
  • Hands-on Simulations

Week-10

  • Flat Models
  • Introduction to JTAG/IJTAG
  • Introductions to PADS
  • BS Insertion
  • JTAG/IJTAG FSM
  • Instructions of JTAG/IJTAG

Week-11

  • Introduction to MBIST
  • Memory faults
  • Memory grouping
  • Memory basics
  • Algorithms
    • Zero-one, CHBK , MATS .MARCH ,SMARCH ..etc
  • MBIST Insertion on RTL
  • Hands on BIST insertion
  • Assignments

Week-12

  • Discussion of Interview questions
  • Compactor explanation
  • Memory pipelining
  • ET flow
  • Introduction to SpyGlass
  • Hierarchical BIST insertion
  • Hands of multi core MBIST insertion
  • Assignments

Week-13

  • Complete Flow of BIST insertion and validation
  • Clock Monitoring
  • ICL network
  • EDT and OCC insertion on RTL
  • Gray box generation
  • Assignments

Week-14

  • Introduction to ICL and PDL
  • Scan Wrapper insertion – Hierarchical Flow
  • Intest and Extest Hands on Lab sessions
  • Assignments
  • ATPG Flow with TSDB
  • Faults merging

WEEK-15

  • Controlling PLL and CLK Gen’s using ICL and PDL
  • Introduction to BISR
  • Auxiliary Pins
  • Revision of JTAG/IJTAG and BIST concepts

WEEK-16

  • Support for Mock interviews
  • Interactive sessions
  • Complete Revision of DFT as follows:
    • DFT Overview
    • SCAN
    • COMPRESSION
    • OCC
    • JTAG/IJTAG
    • MBIST/MBISR
    • ATPG
    • SIMULATIONS – ATPG and BIST
    • Handling third party IP’s for DFT
    • DFT Insertions in both RTL and NETLIST
  • Total 4 levels of Projects in the entire course duration. Each Level contains 5-10 Working Labs.
Course DFT Training
Duration 22 weeks (6 weeks of basics training, 16 weeks of core DFT training)
Next Batch 21/Nov
Schedule Weekend students: Saturday & Sunday(9AM – 5PM India time)
Full week students: 6 days/week, 9AM – 1PM, Friday is break
Course repeats every 8 weeks
Tool Mentor Graphics Tessent, Synopsys DFTAdvisor and Tetramax
Mode of training Live online training
e-learning course for self paced learning
Tool Access Tool access at the institute for one year duration
Certificate Issued based on 50% assignment completion as criteria
Batch Size 20
Assignments 20

DFT weekly Schedule

What are the Course Prerequisites?

  • Course does not have any pre-requisites. However any exposure to Digital design, VLSI design flow is an added advantage.

What if I miss few sessions during course?

  • Each session of course is recorded, missed session videos will be shared

Course has started few weeks back, can I still join the course in between?

  • Yes, You will have option to view the recorded videos of course for the sessions missed
  • You will have option to repeat the course any time in next 1 year

Do you offer support after course completion?

  • Yes, Course fee also includes support for doubt clarification sessions even after course completion
  • You have option to mail you queries
  • Option to meet in person to clarify doubts
DFT Course Material Access
Course material Shared over google drive
Course page access Get login details from Admin
Assignments-Checklist-Session notes Course page
Labs Copy labs from /home/vlsiguru/DFT/ to /home/user_ID/ Refer to README files in individual folders.
Labs are available for Scan-compression-JTAG-BIST and pattern simulations.
How to use course material Shared as part of Course material
Resume update Course page
Interview Questions Uploaded to course page

Student will get access to assignments, labs, session notes, interview questions, sample resumes on course page.

Session Notes Link
WEEK1 DFT BASICS Click here
WEEK2 SCAN INSERTION Click here
WEEK3 SCAN INSERTION Click here
WEEK4 Click here
WEEK5 Click here
WEEK6 Click here
WEEK7 MBIST Click here
WEEK8 ATPG Click here
WEEK9 Click here
WEEK10 ATSPEED Click here

 

ASSIGNMENTS Link
BASIC DFT Click here
SCAN Click here
COMPRESSION Click here
MBIST Click here
ATPG Click here
SIMULATIONS Click here
JTAG Click here

 

LAB ASSIGNMENTS Link
SCAN Click here
ATPG Click here

 

PRESENATATIONS Link
DFT Basics Click here
SCAN INSERTION PART1 Click here
SCAN INSERTION PART2 Click here
COMPRESSION Click here
MBIST Click here

 

LAB INSTRUCTIONS Link
ATPG Click here
SCAN Click here
  • Target Audience:
    • BTech, MTech Freshers planning to make career in DFT
    • Engineers with prior experience in other domains of VLSI or experience non-VLSI domains, want to make career in DFT
    • Engineering college faculty looking to enhance their VLSI skill set
  • Trainer Profile
    • 12+ years experience
    • Experience of working on multiple complex SOC projects
  • Remaining fee can be paid in 2 instalments with gap of 1.5 months
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