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DFT Training

DFT(Design for Testability) involves using SCAN, ATPG and BIST techniques to add testability to Hardware design. These techniques are targeted towards making it easier to develop and apply tests to the manufactured hardware. There tests in turn help catch manufacturing defects like stuck at 0, 1 faults, etc.

DFT Training will focus on all aspects of testability flow including testability basics, SOC Scan Architecture, different scan types, ATPG DRC Debug, ATPG Simulation debug, and DFT diagnosis. DFT Training course will also focus on JTAG, MemoryBIST, LogicBIST, Scan and ATPG, test compression techniques and Hierarchical scan design.

As part of DFT Training, a complex design example with variety of memories spread around the design used as a reference for learning all testability. While MBIST used to test memories. Boundary scan is a requirement for designs, used to control the MBIST controllers that are created to minimize the need for having extra external pins to run the memory tests.  ATPG test patterns will be created for various different fault models like stuck-at, transition delay, path delay fault models. Various TestKompress techniques will be used to compress test patterns to ensure patterns can be applied on minimal number of IO pins used during test. Compressed test patterns will run more quickly on the production test floor and require less tester memory. Patterns are validated through Simulations.

DFT Training course is designed as per the current industry requirements with multiple hands on projects based on Scan, ATPG and MBIST. DFT Training will help student with in-depth knowledge of all testability techniques. Hands-on project will involve creating large number of test cases for various aspects like Scan insertion, Compression and ATPG pattern generation using MentorGraphics Tessent tool.  More importance is given to basic concepts, interaction sessions, hands-on, important notes and assignments.

MentorGraphics Tessent tool will be used for training. As per survey, it is used by more than 80% companies for DFT. Student will have access to tool for during the course, with provision to extend beyond. Student will get access to tool both at institute and has option to connect to servers from home using VPN.

Design For Testability

  • DFT(Design for Testability) involves using SCAN, ATPG and BIST techniques to add testability to Hardware design. These techniques are targeted towards making it easier to develop and apply tests to the manufactured hardware. There tests in turn help catch manufacturing defects like stuck at 0, 1 faults, etc.

    DFT Training will focus on all aspects of testability flow including testability basics, SOC Scan Architecture, different scan types, ATPG DRC Debug, ATPG Simulation debug, and DFT diagnosis. DFT Training course will also focus on JTAG, MemoryBIST, LogicBIST, Scan and ATPG, test compression techniques and Hierarchical scan design.

    As part of DFT Training, a complex design example with variety of memories spread around the design used as a reference for learning all testability. While MBIST used to test memories. Boundary scan is a requirement for designs, used to control the MBIST controllers that are created to minimize the need for having extra external pins to run the memory tests. ATPG test patterns will be created for various different fault models like stuck-at, transition delay, path delay fault models. Various TestKompress techniques will be used to compress test patterns to ensure patterns can be applied on minimal number of IO pins used during test. Compressed test patterns will run more quickly on the production test floor and require less tester memory. Patterns are validated through Simulations.

    DFT Training course is designed as per the current industry requirements with multiple hands on projects based on Scan, ATPG and MBIST. DFT Training will help student with in-depth knowledge of all testability techniques. Hands-on project will involve creating large number of test cases for various aspects like Scan insertion, Compression and ATPG pattern generation using MentorGraphics Tessent tool. More importance is given to basic concepts, interaction sessions, hands-on, important notes and assignments.

    MentorGraphics Tessent tool will be used for training. As per survey, it is used by more than 80% companies for DFT. Student will have access to tool for 6 months after course completion, with provision to extend beyond. Student will get access to tool both at institute and has option to connect to servers from home using VPN.

    • Design For Testability

      • DFT Basics
      • SoC Scan architecture overview
      • Types of Scan
      • ATPG DRC Debug
      • ATPG Simulation Mismatch Debug
      • DFT Diagnosis
      • JTAG
      • MemoryBIST
      • LogicBIST
      • Scan and ATPG
      • Test compression technigues
      • Hierarchical Scan Design

    • Week-1

      • Full SOC flow - DFT
      • DFT Architecture and Basics
      • Test Plan
      • Different DFT schemes
      • Comparison between Functional and DFT Vectors

    • Week-2

      • Understanding of SCAN Insertion
      • Scan methodology
      • Types of Scan
      • Top-down and Bottom-up Approach
      • Scan insertion Flow
      • Scan operation

    • Week-3

      • Scan insertion Scripts
      • Multiple Clock domains
      • Design Rule Checking
      • Pre-DRC and Post DRC
      • Lock up and Terminal lockup latches
      • Hands-on Scan insertion
      • Assignments
      • Interaction Sessions

    • Week-4

      • Introduction to compression
      • Compression Architecture
      • Decompressor and Compactor
      • Compression Ratio
      • DRC Analysis

    • Week-5

      • Modular Compression
      • X-Masking logic
      • Hands-on Compression
      • Assignments
      • Interaction Sessions

    • Week-6

      • Scan insertion with compression
      • On-chip clocking for at-speed testing
      • Hierarchical Scan Design
      • Bypass mode
      • Hands on Scan and compression
      • Interaction session scan and compression

    • Week-7

      • Introduction to MBIST
      • Memory grouping
      • Controller generation
      • Memory faults
      • Algorithms
      • Diagnostic mode

    • Week-8

      • ATPG Overview
      • Different types of Faults
      • Types of fault models
      • ATPG algorithm
      • Understand complete Test procedure
      • Hands on Project

    • Week-9

      • DRC analysis
      • Test Coverage and Fault Coverage
      • Coverage improvement Analysis
      • Chain and Capture patterns
      • Assignments
      • Interaction Sessions
      • Simulations- Notiming and Timing simulations

    • Week-10

      • At speed fault model (In detail)
      • Understanding Transition fault ATPG
      • Two pulse generator
      • Test procedure
      • Launch on capture and Launch on Shift
      • Top-off Pattern generation
      • Path delay

    • Week-11

      • Introduction to JTAG
      • JTAG State Machine
      • Boundary Scan
      • Different instructions
      • Industry Standard Project

    • Week-12

      • Introduction to LBIST
      • SPYGLASS
      • Revision
      • Mock Interview
  • Course DFT Training
    Duration 10 weeks
    Next Batch 26-Aug
    Demo Session 26-Aug(02:00PM - 5:30PM)
    Registration 27-Aug(after attending demo session on 27-Aug)
    Schedule Both Saturday & Sunday(02:00PM - 5:30PM India time)
    Course repeats every 10 weeks
    Fee INR 24000/- + Tax
    Tool Tessent
    Mode of training Classroom training at VLSIGuru Institute(Horamavu)
    Online training using live training sessions
    Tool Access 24X7 access using VPN
    Certificate Issued based on 50% assignment completion as criteria
    Admission criteria Student need to undergo evaluation test
    Batch Size 20
    Assignments 20
    Placement support Interview opportunity in at least 6 companies
    100% job on completion of all assignments
    and scoring good grade in monthly evaluation test
    Trainer 12+ Years exp in RTL design & Functional verification

    • What are the Course Prerequisites?

      • Exposure to Basic Scan concepts

    • What if I miss few sessions during course?

      • Each session of course is recorded, missed session videos will be shared

    • Course has started few weeks back, can I still join the course in between?

      • Yes, You will have option to view the recorded videos of course for the sessions missed
      • You will have option to repeat the course any time in next 1 year

    • Do you offer support after course completion?

      • Yes, Course fee also includes support for doubt clarification sessions even after course completion
      • You have option to mail you queries
      • Option to meet in person to clarify doubts
  • Course Material Shared:
    • DFT quick reference manual
    • DFT Checklist
    • DFT Tool user guide
  • Target Audience:
    • BTech, MTech Freshers planning to make career in DFT
    • Engineers with prior experience in other domains of VLSI or experience non-VLSI domains, want to make career in DFT
    • Engineering college faculty looking to enhance their VLSI skill set
  • Trainer Profile
    • 12+ years experience
    • Experience of working on multiple complex SOC projects
Quality VLSI Training at Affordable Fee.

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